LURF22443-PF doc. no : qw0905-LURF22443-PF rev. : a date : 19 - aug. - 2006 data sheet ligitek electronics co.,ltd. property of ligitek only super bright round type led lamps lead-free parts pb
0 -60 100% 50% 75% 25% -30 100% 25% 050%75% 30 60 1.0min 2.54typ 0.5 typ 1.5max 3.55 3.85 4.28 5.28 0.5 25.0min 3.1 ligitek electronics co.,ltd. property of ligitek only 1/5 page part no. LURF22443-PF package dimensions note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation + -
t opr operating temperature -40 ~ +85 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) red material part no LURF22443-PF algainp storage temperature spectral halfwidth nm forward voltage @20ma(v) viewing angle 2 1/2 (deg) luminous intensity @20ma(mcd) dominant wave length dnm water clear emitted lens 63020 2.4 max. 1.5 min. 1100 min. 20 1800 typ. -40 ~ +100 color tstg absolute maximum ratings at ta=25 electrostatic discharge( * ) forward current reverse current @5v peak forward current duty 1/10@10khz power dissipation parameter page 2/5 2000 ratings i f esd ir pd i fp symbol ma 50 10 120 130 a v ma mw urf unit ligitek electronics co.,ltd. property of ligitek only static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * part no. LURF22443-PF
r e l a t i v e i n t e n s i t y @ 2 0 m a 600 wavelength (nm) 550 0 700 650 0.5 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 20 ambient temperature( ) fig.5 relative intensity vs. wavelength 1.0 ambient temperature( ) 0.8 -0 -20 -4060 40 2080100 0 -40-20-060 4080100 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 100 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a f o r w a r d c u r r e n t ( m a ) forward current(ma) forward voltage(v) 1.5 1.0 0.1 2.5 2.03.01.010 0 1.0 10 0.5 1.0 1.5 2.0 1001000 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage 1000 3.5 2.5 typical electro-optical characteristics curve ligitek electronics co.,ltd. property of ligitek only 3.0 urf chip 3/5 page part no. LURF22443-PF
dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 60 seconds max 2 /sec max 0 0 preheat 25 50 100 time(sec) 150 260 120 5 /sec max temp( c) 260 c3sec max soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time) distance:2mm min(from solder joint to body) 2.wave soldering profile ligitek electronics co.,ltd. property of ligitek only page 4/5 part no. LURF22443-PF
1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.t.sol=230 5 2.dwell time=5 1sec this test intended to see soldering well performed or not. solderability test thermal shock test solder resistance test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 5 2.dwell time= 10 1sec. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 ligitek electronics co.,ltd. property of ligitek only reliability test: high temperature storage test low temperature storage test high temperature high humidity test 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hours. 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. test item operating life test description test condition 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 page 5/5 part no. LURF22443-PF
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